IN-GRAPH CAUSALITY RANKING FOR FAULTS IN THE DESIGN OF INTEGRATED CIRCUITS

In some aspects, a graph is used to assist users in cause analysis of faults. The graph represents signal flow through a design of an integrated circuit The graph includes graph elements, such as nodes and edges. The nodes may represent cells and nets in the circuit design, and the edges may represe...

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Bibliographische Detailangaben
Hauptverfasser: Liao, Hsiang-Chieh, Yen, Chia-Chih, Gao, Xiang, Obilisetty, Sashikala Venkata
Format: Patent
Sprache:eng
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Zusammenfassung:In some aspects, a graph is used to assist users in cause analysis of faults. The graph represents signal flow through a design of an integrated circuit The graph includes graph elements, such as nodes and edges. The nodes may represent cells and nets in the circuit design, and the edges may represent signal flow between the cells and nets. A propagation model for the propagation of faults through the graph is constructed. The propagation model includes local propagation models for the propagation of faults through the graph elements. Propagation of a known fault backward through the graph is modeled using the propagation model. This results in a causality ranking of the graph elements as possible causes of the known fault. Information indicative of the causality ranking is displayed in a user interface that shows the design of the integrated circuit.