APPARATUS CONFIGURED TO PERFORM A TEST OPERATION

APPARATUS CONFIGURED TO PERFORM A TEST OPERATION

An apparatus includes a selection data generation circuit configured to generate selection data from fuse data or generate the selection data having a preset test input pattern, depending on whether a failure test is entered; and a failure flag generation circuit configured to generate latch data by...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LEE, Dong Beom, JEONG, Hyeong Soo
Format: Patent
Sprache:eng
Schlagworte:
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Beschreibung
Zusammenfassung:An apparatus includes a selection data generation circuit configured to generate selection data from fuse data or generate the selection data having a preset test input pattern, depending on whether a failure test is entered; and a failure flag generation circuit configured to generate latch data by latching the selection data, and generate a failure flag by detecting whether the latch data has a preset test pattern.