Method of Measuring Aberration and Electron Microscope

A method of measuring an aberration in an electron microscope includes: acquiring an image for measuring the aberration in the electron microscope; and measuring the aberration by using the image. In measuring the aberration, a direction of defocusing is specified based on a residual aberration that...

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Bibliographische Detailangaben
Hauptverfasser: Morishita, Shigeyuki, Sagawa, Ryusuke, Uematsu, Fuminori, Nakamichi, Tomohiro, Aibara, Keito
Format: Patent
Sprache:eng
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Zusammenfassung:A method of measuring an aberration in an electron microscope includes: acquiring an image for measuring the aberration in the electron microscope; and measuring the aberration by using the image. In measuring the aberration, a direction of defocusing is specified based on a residual aberration that is uniquely determined by a configuration of an optical system of the electron microscope and an optical condition of the optical system.