IMPEDANCE MEASUREMENT FOR A HAPTIC LOAD

In some implementations, a measurement circuit may drive, using a first transistor, a first node of a haptic load. The measurement circuit may trigger a first comparator when a voltage driving the haptic load satisfies a first condition. The first comparator may have a first node connected, in paral...

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Bibliographische Detailangaben
Hauptverfasser:	SALAZAR, Nathaniel, ZAZZERA, Joshua, RUTKOWSKI, Joseph Dale, SHEN, Liangguo
Format:	Patent
Sprache:	eng
Schlagworte:	ALARM SYSTEMS CONTROL OR REGULATION OF ELECTRIC MOTORS, ELECTRIC GENERATORSOR DYNAMO-ELECTRIC CONVERTERS CONTROLLING TRANSFORMERS, REACTORS OR CHOKE COILS CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ELECTRICITY GENERATION ORDER TELEGRAPHS PHYSICS SIGNALLING SIGNALLING OR CALLING SYSTEMS
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Beschreibung
Zusammenfassung:	In some implementations, a measurement circuit may drive, using a first transistor, a first node of a haptic load. The measurement circuit may trigger a first comparator when a voltage driving the haptic load satisfies a first condition. The first comparator may have a first node connected, in parallel, to a drain of a second transistor and may have a second node connected to the first node of the haptic load. Additionally, the second transistor may have a gate connected to a gate of the first transistor and may have the drain connected to a first reference current.