FACILITATING ANALYSIS OF ATTRIBUTION MODELS

Methods and systems are provided for facilitating analysis of attribution models. In embodiments described herein, an indication to compare a set of attribution models is received. For each attribution model, a lift score is determined that indicates an extent of improvement as compared to a baselin...

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Bibliographische Detailangaben
Hauptverfasser: SNYDER, JR., James William, SUN, Yiwen, ARAVA, Sai Kumar, YAN, Zhenyu
Format: Patent
Sprache:eng
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Zusammenfassung:Methods and systems are provided for facilitating analysis of attribution models. In embodiments described herein, an indication to compare a set of attribution models is received. For each attribution model, a lift score is determined that indicates an extent of improvement as compared to a baseline attribution model. The lift score can be generated based at least on a divergence between a weighted-positive path distribution and a negative path distribution determined using a sign correction term and/or on a divergence between a weighted-positive path distribution and a reference distribution, which reflects the deviation between positive and negative paths. The weighted-positive path distribution reflects attribution scores, generated via the corresponding attribution model, applied as weights to a positive event paths and used to produce a distribution. Thereafter, the lift scores associated with the corresponding attribution models can be used to provide an indication of a most effective attribution model, or relative performance, of the set of attribution models.