POSITION SPECIFYING METHOD AND SIMULATION METHOD

A position specifying method includes generating relation information based on first coordinates and second coordinates, the first coordinates indicating coordinates of a portion of a target object in three dimensions, at which a specific point is located, in a state where a prof ector projects the...

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Bibliographische Detailangaben
1. Verfasser:	YAMAUCHI, Taisuke
Format:	Patent
Sprache:	eng
Schlagworte:	ACCESSORIES THEREFOR APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM CINEMATOGRAPHY ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY ELECTROGRAPHY HOLOGRAPHY MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHOTOGRAPHY PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION TESTING
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Beschreibung
Zusammenfassung:	A position specifying method includes generating relation information based on first coordinates and second coordinates, the first coordinates indicating coordinates of a portion of a target object in three dimensions, at which a specific point is located, in a state where a prof ector projects the projection image having the specific point onto the target object, the second coordinates indicating coordinates of the specific point in the projection image in two dimensions, the relation information indicating a correspondence between a three-dimensional coordinate system and a projector coordinate system, the three dimensional coordinate system being used by a measuring instrument that specifies the first coordinates, the projector coordinate system defining the second coordinates and coordinates of the projector, and specifying a position of the projector in the three-dimensional coordinate system based on the coordinates of the projector, by using the relation information.