MODULATED ATOMIC LAYER DEPOSITION

Methods and apparatuses for depositing thin films using long and short conversion times during alternating cycles of atomic layer deposition (ALD) are provided herein. Embodiments involve alternating conversion duration of an ALD cycle in one or more cycles of a multi-cycle ALD process. Some embodim...

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Bibliographische Detailangaben
Hauptverfasser: Agarwal, Pulkit, van Schravendijk, Bart J, Bhandari, Shiva Sharan, Soe, Chan Myae Myae, LaVoie, Adrien, Baldasseroni, Chloe
Format: Patent
Sprache:eng
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Zusammenfassung:Methods and apparatuses for depositing thin films using long and short conversion times during alternating cycles of atomic layer deposition (ALD) are provided herein. Embodiments involve alternating conversion duration of an ALD cycle in one or more cycles of a multi-cycle ALD process. Some embodiments involve modulation of dose, purge, pressure, plasma power or plasma energy in two or more ALD cycles.