INSPECTION DEVICE, INSPECTION METHOD, MACHINE LEARNING DEVICE, AND MACHINE LEARNING METHOD

The purpose of the present invention is to improve accuracy in inspection of an appearance of a mold. The inspection device includes at least one processor for performing an inspection step of inspecting an appearance of a mold using a learned model constructed by machine learning. Input into the le...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	SUGINO, Takehiro, SONOHARA, Takeshi
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The purpose of the present invention is to improve accuracy in inspection of an appearance of a mold. The inspection device includes at least one processor for performing an inspection step of inspecting an appearance of a mold using a learned model constructed by machine learning. Input into the learned model includes an inspection image obtained by imaging the appearance of the mold. Output from the learned model is information indicating an inspection result of the appearance of the mold.