CHARGED PARTICLE MICROSCOPE SYSTEMS AND CLUSTERING PROCESSES FOR HIGH DYNAMIC RANGE SAMPLE ANALYSIS
Methods and systems for high dynamic range (HDR) charged particle analysis using clustering processes include accessing a plurality of instances of image data for a region of a sample, where each instance of image data was captured with different parameters by a charged particle microscope. The diff...
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| creator | Levien, Cody Owen, Michael James Howell, Garth Tûma, Tomás |
| description | Methods and systems for high dynamic range (HDR) charged particle analysis using clustering processes include accessing a plurality of instances of image data for a region of a sample, where each instance of image data was captured with different parameters by a charged particle microscope. The difference in parameters may include one or more of a difference in contrast, brightness, beam strength, beam type, gamma, and/or a combination thereof. An HDR charged particle microscopy data structure is then generated using the captured image data, and one or more features of the sample are identified based on the HDR charged particle microscopy data structure. In some methods according to the present invention, the methods further include performing EDS analysis on the sample based on the determined one or more identified features. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2022207256A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2022207256A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2022207256A13</originalsourceid><addsrcrecordid>eNqNjLEKwjAURbs4iPoPD5yFGlHnx-trEmiTkNcOnUopcRIt1P_HDH6A0-XAOXdbzGQwaq4gYOwsNQytpeiFfGCQQTpuBdBVQE2fIVqnIURPLMICtY9grDZQDQ5zCBGdzh22IT-hw2YQK_ti85ieazr8dlcca-7InNLyHtO6THN6pc_YiyqVUuVdXW94vvxnfQECsTVN</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CHARGED PARTICLE MICROSCOPE SYSTEMS AND CLUSTERING PROCESSES FOR HIGH DYNAMIC RANGE SAMPLE ANALYSIS</title><source>esp@cenet</source><creator>Levien, Cody ; Owen, Michael James ; Howell, Garth ; Tûma, Tomás</creator><creatorcontrib>Levien, Cody ; Owen, Michael James ; Howell, Garth ; Tûma, Tomás</creatorcontrib><description>Methods and systems for high dynamic range (HDR) charged particle analysis using clustering processes include accessing a plurality of instances of image data for a region of a sample, where each instance of image data was captured with different parameters by a charged particle microscope. The difference in parameters may include one or more of a difference in contrast, brightness, beam strength, beam type, gamma, and/or a combination thereof. An HDR charged particle microscopy data structure is then generated using the captured image data, and one or more features of the sample are identified based on the HDR charged particle microscopy data structure. In some methods according to the present invention, the methods further include performing EDS analysis on the sample based on the determined one or more identified features.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; HANDLING RECORD CARRIERS ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS ; PRESENTATION OF DATA ; RECOGNITION OF DATA ; RECORD CARRIERS</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220630&DB=EPODOC&CC=US&NR=2022207256A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220630&DB=EPODOC&CC=US&NR=2022207256A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Levien, Cody</creatorcontrib><creatorcontrib>Owen, Michael James</creatorcontrib><creatorcontrib>Howell, Garth</creatorcontrib><creatorcontrib>Tûma, Tomás</creatorcontrib><title>CHARGED PARTICLE MICROSCOPE SYSTEMS AND CLUSTERING PROCESSES FOR HIGH DYNAMIC RANGE SAMPLE ANALYSIS</title><description>Methods and systems for high dynamic range (HDR) charged particle analysis using clustering processes include accessing a plurality of instances of image data for a region of a sample, where each instance of image data was captured with different parameters by a charged particle microscope. The difference in parameters may include one or more of a difference in contrast, brightness, beam strength, beam type, gamma, and/or a combination thereof. An HDR charged particle microscopy data structure is then generated using the captured image data, and one or more features of the sample are identified based on the HDR charged particle microscopy data structure. In some methods according to the present invention, the methods further include performing EDS analysis on the sample based on the determined one or more identified features.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>HANDLING RECORD CARRIERS</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><subject>PRESENTATION OF DATA</subject><subject>RECOGNITION OF DATA</subject><subject>RECORD CARRIERS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjLEKwjAURbs4iPoPD5yFGlHnx-trEmiTkNcOnUopcRIt1P_HDH6A0-XAOXdbzGQwaq4gYOwsNQytpeiFfGCQQTpuBdBVQE2fIVqnIURPLMICtY9grDZQDQ5zCBGdzh22IT-hw2YQK_ti85ieazr8dlcca-7InNLyHtO6THN6pc_YiyqVUuVdXW94vvxnfQECsTVN</recordid><startdate>20220630</startdate><enddate>20220630</enddate><creator>Levien, Cody</creator><creator>Owen, Michael James</creator><creator>Howell, Garth</creator><creator>Tûma, Tomás</creator><scope>EVB</scope></search><sort><creationdate>20220630</creationdate><title>CHARGED PARTICLE MICROSCOPE SYSTEMS AND CLUSTERING PROCESSES FOR HIGH DYNAMIC RANGE SAMPLE ANALYSIS</title><author>Levien, Cody ; Owen, Michael James ; Howell, Garth ; Tûma, Tomás</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2022207256A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>HANDLING RECORD CARRIERS</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><topic>PRESENTATION OF DATA</topic><topic>RECOGNITION OF DATA</topic><topic>RECORD CARRIERS</topic><toplevel>online_resources</toplevel><creatorcontrib>Levien, Cody</creatorcontrib><creatorcontrib>Owen, Michael James</creatorcontrib><creatorcontrib>Howell, Garth</creatorcontrib><creatorcontrib>Tûma, Tomás</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Levien, Cody</au><au>Owen, Michael James</au><au>Howell, Garth</au><au>Tûma, Tomás</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CHARGED PARTICLE MICROSCOPE SYSTEMS AND CLUSTERING PROCESSES FOR HIGH DYNAMIC RANGE SAMPLE ANALYSIS</title><date>2022-06-30</date><risdate>2022</risdate><abstract>Methods and systems for high dynamic range (HDR) charged particle analysis using clustering processes include accessing a plurality of instances of image data for a region of a sample, where each instance of image data was captured with different parameters by a charged particle microscope. The difference in parameters may include one or more of a difference in contrast, brightness, beam strength, beam type, gamma, and/or a combination thereof. An HDR charged particle microscopy data structure is then generated using the captured image data, and one or more features of the sample are identified based on the HDR charged particle microscopy data structure. In some methods according to the present invention, the methods further include performing EDS analysis on the sample based on the determined one or more identified features.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING HANDLING RECORD CARRIERS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS |
| title | CHARGED PARTICLE MICROSCOPE SYSTEMS AND CLUSTERING PROCESSES FOR HIGH DYNAMIC RANGE SAMPLE ANALYSIS |
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