SEMICONDUCTOR DEVICE
During an ON period of a high breakdown voltage switch provided within an ON period of a semiconductor switching element, a detection circuit outputs to a predetermined node a voltage obtained by dividing an inter-terminal voltage by a plurality of resistor elements. A voltage comparison circuit out...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Zusammenfassung: | During an ON period of a high breakdown voltage switch provided within an ON period of a semiconductor switching element, a detection circuit outputs to a predetermined node a voltage obtained by dividing an inter-terminal voltage by a plurality of resistor elements. A voltage comparison circuit outputs a detection signal indicating whether or not the inter-terminal voltage is greater than a predetermined determination voltage based on a comparison between the voltage of the predetermined node and a predetermined DC voltage. The high breakdown voltage switch has a breakdown voltage greater than a potential difference between a high potential and a low potential during an OFF period. |
|---|