SPECIMEN ANALYZER AND SPECIMEN ANALYSIS METHOD

SPECIMEN ANALYZER AND SPECIMEN ANALYSIS METHOD

The specimen analyzer includes: an input unit which receives an input of subject attribute information; an analysis unit which performs measurement of a specimen collected from a subject, and which performs analysis of the specimen based on a measurement result and the subject attribute information...

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Hauptverfasser: KOMOTO, Takeshi, HIRAYAMA, Hideki, YOSHIDA, Takashi, TAKEMOTO, Seiji, AUSDENMOORE, James
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator KOMOTO, Takeshi
HIRAYAMA, Hideki
YOSHIDA, Takashi
TAKEMOTO, Seiji
AUSDENMOORE, James
description The specimen analyzer includes: an input unit which receives an input of subject attribute information; an analysis unit which performs measurement of a specimen collected from a subject, and which performs analysis of the specimen based on a measurement result and the subject attribute information received by the input unit; and a controller which causes the analysis unit to be incapable of analyzing the specimen unless the input of the subject attribute information is performed with the input uni.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title SPECIMEN ANALYZER AND SPECIMEN ANALYSIS METHOD
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