SPECIMEN ANALYZER AND SPECIMEN ANALYSIS METHOD

The specimen analyzer includes: an input unit which receives an input of subject attribute information; an analysis unit which performs measurement of a specimen collected from a subject, and which performs analysis of the specimen based on a measurement result and the subject attribute information...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	KOMOTO, Takeshi, HIRAYAMA, Hideki, YOSHIDA, Takashi, TAKEMOTO, Seiji, AUSDENMOORE, James
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The specimen analyzer includes: an input unit which receives an input of subject attribute information; an analysis unit which performs measurement of a specimen collected from a subject, and which performs analysis of the specimen based on a measurement result and the subject attribute information received by the input unit; and a controller which causes the analysis unit to be incapable of analyzing the specimen unless the input of the subject attribute information is performed with the input uni.