SELECTIVE MARGIN TESTING TO DETERMINE WHETHER TO SIGNAL TRAIN A MEMORY SYSTEM

SELECTIVE MARGIN TESTING TO DETERMINE WHETHER TO SIGNAL TRAIN A MEMORY SYSTEM

Method, systems and apparatuses may provide for technology that executes a margin test of a first memory storage based on a subset of first signals associated with the first memory storage. The technology determines, based on the margin test, first margin data to indicate whether the first memory st...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: WU, Dujian, GE, Shijian, BU, Daocheng
Format: Patent
Sprache:eng
Schlagworte:
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Beschreibung
Zusammenfassung:Method, systems and apparatuses may provide for technology that executes a margin test of a first memory storage based on a subset of first signals associated with the first memory storage. The technology determines, based on the margin test, first margin data to indicate whether the first memory storage complies with one or more electrical constraints. The technology determines, based on the first margin data, whether to execute a signal training process.