NONCONTACT SENSOR CALIBRATION USING SINGLE AXIS MOVEMENT

A probe calibration method and calibration artifact (30, 70) whereby calibration can be performed without the use of machine axes capable of three dimensional positioning of a probe relative to a calibration sphere (40). The method includes a plurality of calibration spheres fixed in relation to one...

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Bibliographische Detailangaben
Hauptverfasser: Shepherd, Ethan James, Wagaj, Parag P
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A probe calibration method and calibration artifact (30, 70) whereby calibration can be performed without the use of machine axes capable of three dimensional positioning of a probe relative to a calibration sphere (40). The method includes a plurality of calibration spheres fixed in relation to one another via a rigid structure comprising a calibration artifact body (30, 70). The spheres are mounted such that each will be sensed by the probe at some position of a machine axis (W, N). In other words, the spheres lie in the region swept out by the sensor field of view (8, 78) over the movement of the machine axis. The calibration spheres are located at known positions (A, B, C) and the calibration artifact body is designed such that it may be mounted in a known location in place of a work piece.