Image Evaluation Apparatus and Image Evaluation Method

The purpose of the present invention is to provide an image evaluation device and method which can detect unknown defects and which can prevent misrecognition by a machine learning model. This image evaluation device, which uses a machine learning classifier to classify defect information in a defect image of an electronic device, is characterized by being provided with: an image storage unit which stores a defect image of an electronic device; a defect region storage unit which stores defect region information that is in the defect image; a classifier which classifies the defect information with machine learning; an image extraction unit which, in the course of the defect image classification processing, extracts image-of-interest information which the classifier will focus on; and an evaluation unit which compares the image-of-interest information and the defect region information to evaluate the classifiability of the defect image.