PROCESSING TIME-SERIES MEASUREMENTS FOR LIDAR ACCURACY
An optical measurement system may include a light source and corresponding photosensor configured to emit and detect photons reflected from objects in a surrounding environment for optical measurements. An initial peak can be identified as resulting from reflections off a housing of the optical meas...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | An optical measurement system may include a light source and corresponding photosensor configured to emit and detect photons reflected from objects in a surrounding environment for optical measurements. An initial peak can be identified as resulting from reflections off a housing of the optical measurement system. This peak can be removed or used to calibrate measurement calculations of the system. Peaks resulting from reflections off surrounding objects can be processed using on-chip filters to identify potential peaks, and the unfiltered data can be passed to an off-chip processor for distance calculations and other measurements. A spatial filtering technique may be used to combine values from histograms for spatially adjacent pixels in a pixel array. This combination can be used to increase the confidence for distance measurements. |
---|