FABRICATING SUB-MICRON CONTACTS TO BURIED WELL DEVICES
A method for forming a semiconductor structure. Two isolation structures are formed in a semiconductor. A cavity is etched in the semiconductor between the two isolation structures in the semiconductor. Dopants are implanted into a bottom side of the cavity to form a doped region in the semiconducto...
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creator | Schmitz, Adele Lee, Kangmu Min Choi, Maxwell Daehan Jura, Michael Pemberton Jackson, Clayton Chappell, James Wright, Jeffrey Alden Ha, Wonill |
description | A method for forming a semiconductor structure. Two isolation structures are formed in a semiconductor. A cavity is etched in the semiconductor between the two isolation structures in the semiconductor. Dopants are implanted into a bottom side of the cavity to form a doped region in the semiconductor below the cavity between the two isolation structures. A contact is formed in the cavity. The contact is on the doped region and in direct contact with the doped region. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2022028989A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2022028989A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2022028989A13</originalsourceid><addsrcrecordid>eNrjZDBzc3QK8nR2DPH0c1cIDnXS9fV0DvL3U3D29wtxdA4JVgjxV3AKDfJ0dVEId_XxUXBxDfN0dg3mYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBkZAZGFpYeloaEycKgCpryjS</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>FABRICATING SUB-MICRON CONTACTS TO BURIED WELL DEVICES</title><source>esp@cenet</source><creator>Schmitz, Adele ; Lee, Kangmu Min ; Choi, Maxwell Daehan ; Jura, Michael Pemberton ; Jackson, Clayton ; Chappell, James ; Wright, Jeffrey Alden ; Ha, Wonill</creator><creatorcontrib>Schmitz, Adele ; Lee, Kangmu Min ; Choi, Maxwell Daehan ; Jura, Michael Pemberton ; Jackson, Clayton ; Chappell, James ; Wright, Jeffrey Alden ; Ha, Wonill</creatorcontrib><description>A method for forming a semiconductor structure. Two isolation structures are formed in a semiconductor. A cavity is etched in the semiconductor between the two isolation structures in the semiconductor. Dopants are implanted into a bottom side of the cavity to form a doped region in the semiconductor below the cavity between the two isolation structures. A contact is formed in the cavity. The contact is on the doped region and in direct contact with the doped region.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220127&DB=EPODOC&CC=US&NR=2022028989A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220127&DB=EPODOC&CC=US&NR=2022028989A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Schmitz, Adele</creatorcontrib><creatorcontrib>Lee, Kangmu Min</creatorcontrib><creatorcontrib>Choi, Maxwell Daehan</creatorcontrib><creatorcontrib>Jura, Michael Pemberton</creatorcontrib><creatorcontrib>Jackson, Clayton</creatorcontrib><creatorcontrib>Chappell, James</creatorcontrib><creatorcontrib>Wright, Jeffrey Alden</creatorcontrib><creatorcontrib>Ha, Wonill</creatorcontrib><title>FABRICATING SUB-MICRON CONTACTS TO BURIED WELL DEVICES</title><description>A method for forming a semiconductor structure. Two isolation structures are formed in a semiconductor. A cavity is etched in the semiconductor between the two isolation structures in the semiconductor. Dopants are implanted into a bottom side of the cavity to form a doped region in the semiconductor below the cavity between the two isolation structures. A contact is formed in the cavity. The contact is on the doped region and in direct contact with the doped region.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDBzc3QK8nR2DPH0c1cIDnXS9fV0DvL3U3D29wtxdA4JVgjxV3AKDfJ0dVEId_XxUXBxDfN0dg3mYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBkZAZGFpYeloaEycKgCpryjS</recordid><startdate>20220127</startdate><enddate>20220127</enddate><creator>Schmitz, Adele</creator><creator>Lee, Kangmu Min</creator><creator>Choi, Maxwell Daehan</creator><creator>Jura, Michael Pemberton</creator><creator>Jackson, Clayton</creator><creator>Chappell, James</creator><creator>Wright, Jeffrey Alden</creator><creator>Ha, Wonill</creator><scope>EVB</scope></search><sort><creationdate>20220127</creationdate><title>FABRICATING SUB-MICRON CONTACTS TO BURIED WELL DEVICES</title><author>Schmitz, Adele ; Lee, Kangmu Min ; Choi, Maxwell Daehan ; Jura, Michael Pemberton ; Jackson, Clayton ; Chappell, James ; Wright, Jeffrey Alden ; Ha, Wonill</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2022028989A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>Schmitz, Adele</creatorcontrib><creatorcontrib>Lee, Kangmu Min</creatorcontrib><creatorcontrib>Choi, Maxwell Daehan</creatorcontrib><creatorcontrib>Jura, Michael Pemberton</creatorcontrib><creatorcontrib>Jackson, Clayton</creatorcontrib><creatorcontrib>Chappell, James</creatorcontrib><creatorcontrib>Wright, Jeffrey Alden</creatorcontrib><creatorcontrib>Ha, Wonill</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Schmitz, Adele</au><au>Lee, Kangmu Min</au><au>Choi, Maxwell Daehan</au><au>Jura, Michael Pemberton</au><au>Jackson, Clayton</au><au>Chappell, James</au><au>Wright, Jeffrey Alden</au><au>Ha, Wonill</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>FABRICATING SUB-MICRON CONTACTS TO BURIED WELL DEVICES</title><date>2022-01-27</date><risdate>2022</risdate><abstract>A method for forming a semiconductor structure. Two isolation structures are formed in a semiconductor. A cavity is etched in the semiconductor between the two isolation structures in the semiconductor. Dopants are implanted into a bottom side of the cavity to form a doped region in the semiconductor below the cavity between the two isolation structures. A contact is formed in the cavity. The contact is on the doped region and in direct contact with the doped region.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | FABRICATING SUB-MICRON CONTACTS TO BURIED WELL DEVICES |
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