COMPLEX PARTICLE MEASUREMENT APPARATUS

COMPLEX PARTICLE MEASUREMENT APPARATUS

A complex particle measurement apparatus comprising a first light source that irradiates a first storage cell; a photodetector that detects intensity of light; a second light source that irradiates a second storage cell; an imaging unit that images a particle group; an image data output unit that ou...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: KIMBA, Takashi, AKAMATSU, Takeshi, NAGURA, Makoto, OKA, Yohei, TATEWAKI, Yasuhiro, AKIYAMA, Hisashi
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A complex particle measurement apparatus comprising a first light source that irradiates a first storage cell; a photodetector that detects intensity of light; a second light source that irradiates a second storage cell; an imaging unit that images a particle group; an image data output unit that outputs image data; a supporter that supports the first storage cell and the second storage cell; and a communication pipe that connects the first storage cell and the second storage cell to pass a sample solution, wherein the first storage cell and the second storage cell have bottom surfaces located at positions different from each other, and the communication pipe is laid such that a channel from the first storage cell to the second storage cell has an incline of not less than 0 or not more than 0.