THERMAL REGION TAGS AND THERMAL REGION OUTLIER DETECTION

A method, device, and system for improving read performance in frequently changing device temperature conditions through detecting thermal region tags and thermal region outliers in a memory device. A plurality of thermal regions may be configured for the memory device. A first temperature may be measured corresponding to opening a storage block of the memory device for programming. A second temperature may then be measured corresponding to closing the storage block for programming. A range between the first temperature and the second temperature may be determined. The range may span N≥2 of the thermal regions. Finally, the storage block may be assigned to a thermal region that includes the second temperature, on condition that N satisfies a threshold.