COMPUTATIONAL SHEAR BY PHASE STEPPED SPECKLE HOLOGRAPHY

A method and apparatus for performing shearography where the shear length and direction can be set in image processing, thus allowing all shear sizes to be computed and tested from a single data set, which can be collected in a single pass over a test surface or test object. The present process assu...

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Bibliographische Detailangaben
Hauptverfasser:	Garan, Jacob D, Acker, Andrew N
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A method and apparatus for performing shearography where the shear length and direction can be set in image processing, thus allowing all shear sizes to be computed and tested from a single data set, which can be collected in a single pass over a test surface or test object. The present process assures that a single data set can be processed with optimal shear length for multiple target types, thus reducing or eliminating the chance of missing a target detection while additionally enhancing target shape analysis by allowing the calculation of target response versus shear length and shear direction.