HIGH RESOLUTION TWO-DIMENSIONAL RESISTANCE TOMOGRAPHY

The disclosed 2-D and 3-D tomographic resistance imaging method improves tomographic resistance image resolution by adopting an orthogonal basis with the maximum number of elements N to describe the maximum resolution resistivity map ρ(r), where this number of elements N is set according to the numb...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Rogers, John Ashley, Aygen, Can Cenap, Costakis, Charles M, Wang, Chulin, Grayson, Matthew Allen, Tzavelis, Andreas, Onsager, Claire Cecelia, Lang, Lauren E
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The disclosed 2-D and 3-D tomographic resistance imaging method improves tomographic resistance image resolution by adopting an orthogonal basis with the maximum number of elements N to describe the maximum resolution resistivity map ρ(r), where this number of elements N is set according to the number of electrodes Q; by defining the orthogonal basis according to any known constraints in the problem, thereby enhancing the resolution where it is needed; by positioning electrodes to be sensitive to these basis functions; and by choosing current I and voltage V contact electrode pairs that maximize signal-to-noise ratio.