METHOD AND DEVICE FOR AUTOMATICALLY TESTING A SWITCHING MEMBER

A method is for testing the functionality of a switching member including at least one switching element. A switching state is influenced via a control input of the switching element and via a control signal generated and output to the control input. An activation signal is output to the control unit and changes the control signal. The activation signal induces a test signal as the change to the control signal and induces a disconnection pulse as the test signal. The SiC or GaN power semiconductor is switched off via the disconnection pulse and conducts current in the reverse direction. In response to the disconnection pulse, the voltage drop is recorded. A comparison is carried out between an indicator and a reference encoding an expected response to the disconnection pulse. Depending on the result of the comparison, a status signal is generated which encodes the functionality of the switching member.