ONLINE MONITORING OF ADDITIVE MANUFACTURING USING ACOUSTIC EMISSION METHODS

Embodiments provide systems and methods for utilizing acoustic sensors to detect defects via online or in situ monitoring of additive manufacturing (AM) processes. Sensors may capture acoustic waves associated with AM manufacturing operations. The acoustic emissions in combination with other sensing...

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Bibliographische Detailangaben
Hauptverfasser:	Gonzalez-Nunez, Miguel A, Saboonchi, Hossain, Hasanian, Mostafa, Godinez-Azcuga, Valery
Format:	Patent
Sprache:	eng
Schlagworte:	ADDITIVE MANUFACTURING TECHNOLOGY ADDITIVE MANUFACTURING, i.e. MANUFACTURING OFTHREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVEAGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING,STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PERFORMING OPERATIONS PHYSICS REGULATING SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDEDFOR SHAPING OR JOINING OF PLASTICS TESTING TRANSPORTING WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
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Beschreibung
Zusammenfassung:	Embodiments provide systems and methods for utilizing acoustic sensors to detect defects via online or in situ monitoring of additive manufacturing (AM) processes. Sensors may capture acoustic waves associated with AM manufacturing operations. The acoustic emissions in combination with other sensing data, such as cameras or thermometers, may be used to characterize the state of the AM process, such as to detect a defect has occurred or confirm a defect has not occurred. When defects are detected, the AM process may be stopped to prevent further processing of a defective part. When defects are predicted as likely to occur, operational parameters of the AM device or process may be adjusted to mitigate the occurrence of a defect. The techniques disclosed herein enable detection of defects that occur underneath the surface of the part being manufactured, as well as correct issues with the AM device or process before a defect occurs.