SYSTEM AND METHOD FOR OPTICALLY READING A SENSOR ARRAY

A system including an optical waveguide having a length extending from an optical interrogator at a first end, a plurality of light-modulating sensor nodes disposed at predetermined locations along the length of the optical waveguide, and (in some embodiments) a plurality of first beam splitters at...

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Bibliographische Detailangaben
Hauptverfasser:	Habif, Jonathan L, Dorfman, Yevgeniy Yakov, Ritter, Scott Evan
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS DETECTING MASSES OR OBJECTS GEOPHYSICS GRAVITATIONAL MEASUREMENTS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A system including an optical waveguide having a length extending from an optical interrogator at a first end, a plurality of light-modulating sensor nodes disposed at predetermined locations along the length of the optical waveguide, and (in some embodiments) a plurality of first beam splitters at each of the predetermined locations along the length of the optical waveguide, each of the first beam splitters configured to direct a portion of an optical signal from the optical interrogator to one of the plurality of light-modulating sensor nodes along an optical waveguide path, and return a reflected optical signal to the optical interrogator in an opposite direction along the same optical waveguide path.