SAMPLE ANALYSIS WITH MIRRORS

SAMPLE ANALYSIS WITH MIRRORS

A device is disclosed, including: a plate including a sample deposition tube adapted to receive a sample comprising one or more analytes, the sample deposition tube defining a vertical axis substantially perpendicular to a main surface of the plate; and a mirror positioned to project, substantially...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: PRESTON, Daniel J, WANG, Yunzhe, DESHLER, Nicolas J, GE, Shencheng, WHITESIDES, George M
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A device is disclosed, including: a plate including a sample deposition tube adapted to receive a sample comprising one or more analytes, the sample deposition tube defining a vertical axis substantially perpendicular to a main surface of the plate; and a mirror positioned to project, substantially parallel to the main surface of the plate, an image of the sample deposition tube along its vertical axis, so as to allow determination of the vertical location of the one or more analytes inside the sample deposition tube. Methods for determining the density of one or more analytes using various embodiments of the device are also described.