HIGH SENSITIVITY PHASE MICROSCOPY IMAGING

Device for phase microscopy comprising:a spatial light modulator,a connecting means adapted to fix the spatial light modulator onto a phase microscope, said phase microscope comprising a light path comprising at least a sample area, a lighting device for lighting said sample area and an imaging devi...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: DE LOS RÍOS SOMMER, Andrés, JUFFMANN, Thomas, GIGAN, Sylvain
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Device for phase microscopy comprising:a spatial light modulator,a connecting means adapted to fix the spatial light modulator onto a phase microscope, said phase microscope comprising a light path comprising at least a sample area, a lighting device for lighting said sample area and an imaging device for capturing a phase image of said sample, said phase image being a 2D matrix of pixels, so that the spatial light modulator is positioned in the light path in a conjugated plane of the sample area anda command of the spatial light modulator connected to the imaging device and adapted to measure the phase shift of a plurality of pixels of the phase image and to command the spatial light modulator in order to subtract the measured phase shifts.