BUILT-IN SELF-TEST FOR LIGHT EMITTING DIODES

In some examples, a device includes a built-in self-test for detecting a fault on a light emitting diode (LED) or on a driver for an LED. The device includes a pair of pads that are configured to connect to the LED. The built-in self-test is configured to control the driver to turn on a respective p...

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Bibliographische Detailangaben
Hauptverfasser:	De Cicco, Adolfo, Chiodo, Rosario
Format:	Patent
Sprache:	eng
Schlagworte:	ELECTRIC HEATING ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	In some examples, a device includes a built-in self-test for detecting a fault on a light emitting diode (LED) or on a driver for an LED. The device includes a pair of pads that are configured to connect to the LED. The built-in self-test is configured to control the driver to turn on a respective pass switch connected to a pad of the pair of pads. The built-in self-test is configured to then determine a voltage level at each pad of the pair of pads. The built-in self-test can determine whether the fault exists on the LED, across the first anode pad and the first cathode pad, or on the driver based on the voltage level at each pad.