METHOD AND SYSTEM FOR EXTRACTING FAULT FEATURE OF ANALOG CIRCUIT BASED ON OPTIMAL WAVELET BASIS FUNCTION

The disclosure discloses an analog circuit fault feature extraction method and system based on an optimal wavelet basis function, and belongs to the field of electronic circuit engineering and computer vision, and the method comprises the steps of obtaining output signals of an analog circuit during different faults; sequentially applying wavelet transformation methods based on different wavelet basis functions to extract features of output signals; for each feature, calculating the center position of each fault, the distance from each fault data point to the center position, the farthest position of the fault data point and the average position of the fault data points; and determining an optimal wavelet basis function for analog circuit fault feature extraction according to a score discriminating method.