FIN ISOLATION STRUCTURE FOR FINFET AND METHOD OF FORMING THE SAME

A semiconductor device structure is provided. The semiconductor device structure includes a substrate having adjacent first and second fins protruding from the substrate. A first gate structure and a second gate structure are across the first and second fins, respectively. An insulating structure is...

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Bibliographische Detailangaben
Hauptverfasser: WU, Chen-Hao, HSIAO, Chun-Wen, LEE, Chu-An, CHAO, Huang-Lin, TSAI, Teng-Chun, JANGJIAN, Peng-Chung
Format: Patent
Sprache:eng
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Zusammenfassung:A semiconductor device structure is provided. The semiconductor device structure includes a substrate having adjacent first and second fins protruding from the substrate. A first gate structure and a second gate structure are across the first and second fins, respectively. An insulating structure is formed between the first gate structure and the second gate structure and includes a first insulating layer separating the first fin from the second fin, a capping structure formed in the first insulating layer, and a second insulating layer covered by the first insulating layer and the capping structure.