SYSTEMS HAVING DEDICATED LIGHT EMITTING DIODES FOR PERFORMANCE CHARACTERIZATION

A system includes a plurality of first LEDs, a plurality of second LEDs, a first controllable current source that is configured to generate a first bias current for driving a first one of the plurality of first LEDs and a plurality of first ones of the plurality of second LEDs, a first measurement c...

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Bibliographische Detailangaben
Hauptverfasser:	BLANK, William Thomas, PAPPAS, Ilias, YEE, Michael, CHILUKURI, Ramakrishna
Format:	Patent
Sprache:	eng
Schlagworte:	ELECTRIC HEATING ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A system includes a plurality of first LEDs, a plurality of second LEDs, a first controllable current source that is configured to generate a first bias current for driving a first one of the plurality of first LEDs and a plurality of first ones of the plurality of second LEDs, a first measurement circuit that is configured to measure a first current-voltage (I-V) performance characteristic of the first one of the plurality of first LEDs, and a lens that is arranged to receive light from the plurality of second LEDs. A property of the first bias current is determined as a function of at least two measurements of the first I-V performance characteristic that are acquired while the first bias current is applied to the first one of the plurality of first LEDs and the plurality of first ones of the plurality of second LEDs.