Method and Circuit for Testing the Functionality of a Transistor Component
In an embodiment, a method for testing a functional integrity of a transistor component, the method includes causing a first change of a charge state of an internal capacitance between control terminals of the transistor component; determining a capacitance value of the internal capacitance based on...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Zusammenfassung: | In an embodiment, a method for testing a functional integrity of a transistor component, the method includes causing a first change of a charge state of an internal capacitance between control terminals of the transistor component; determining a capacitance value of the internal capacitance based on the first change of the charge state; causing a second change of the charge state of the internal capacitance; and evaluating a resistance value of an internal resistance between the control terminals based on the determined capacitance value and the second change of the charge state. |
|---|