METHODS AND SYSTEMS FOR ASCERTAINING FACTORS CONTRIBUTING TO THE TEMPERATURE OF A DEVICE

Methods and systems for ascertaining factors contributing to the temperature of a device. A method includes monitoring a plurality of parameters that are contributing to a temperature of the device. The method also includes estimating a degree of contribution of internal factors to the temperature o...

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Bibliographische Detailangaben
Hauptverfasser:	JAISWAL, Aditi, JACOB, Jaitirth Anthony, BANG, Sungyong, SAHNI, Nikhil, KIM, Hakryoul, JHA, Suraj, JHAWAR, Aditya, JUNG, Sunghun, KIM, Jongwoo, CHIRAYIL SUDHEESH BABU, Vaisakh Punnekkattu, NAIR, Renju Chirakarotu
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING
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Beschreibung
Zusammenfassung:	Methods and systems for ascertaining factors contributing to the temperature of a device. A method includes monitoring a plurality of parameters that are contributing to a temperature of the device. The method also includes estimating a degree of contribution of internal factors to the temperature of the device based on the monitored plurality of parameters and a battery temperature of a battery of the device. The method further includes estimating a degree of contribution of external factors to the temperature of the device, based on the monitored plurality of parameters and a battery temperature of a battery of the device. A neural network can be used for estimating the temperature of the ambience of the device and the impacts of internal and external factors on temperature of the device.