OPEN CIRCUIT DIAGNOSTIC FOR PULSED SOLENOID I/P

Techniques for diagnosing failures in a digital solenoid I/P converter are provided herein. A controller of the I/P converter may apply a fixed voltage to an I/P coil of the I/P converter, causing an armature to move from an off-position to an on-position in a properly-functioning I/P converter. The controller may receive an indication of whether a digital logic line trip has occurred, indicating that a current for the I/P coil has reached a desired maximum current level. The controller may remove the fixed voltage applied to the I/P coil when the maximum current level is reached or when a threshold period of time has elapsed from the application of the fixed voltage to the I/P coil. The controller may diagnose, based on whether the digital logic line trip occurred prior to removing the fixed voltage, a failure in the I/P converter.