METHOD FOR OBSERVING A SAMPLE BY LENSLESS IMAGING

METHOD FOR OBSERVING A SAMPLE BY LENSLESS IMAGING

A method for observing a sample by lensless imaging, in which a sample is positioned between a laser diode and an image sensor, the laser diode being supplied with a supply current whose intensity is less than or equal to a critical value. This critical intensity is determined during preliminary ope...

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1. Verfasser: BLANDIN, Pierre
Format: Patent
Sprache:eng
Schlagworte:
CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHIC PROCESSES OR APPARATUS
HOLOGRAPHY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHOTOGRAPHY
PHYSICS
TESTING
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creator BLANDIN, Pierre
description A method for observing a sample by lensless imaging, in which a sample is positioned between a laser diode and an image sensor, the laser diode being supplied with a supply current whose intensity is less than or equal to a critical value. This critical intensity is determined during preliminary operations, during which the intensity is initially greater than a laser threshold of the diode. By observing the image formed at the image sensor, the intensity is decreased until an attenuation of the interference images on the formed image is observed, the critical intensity corresponding to the intensity at which this attenuation is optimum.
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subjects CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHIC PROCESSES OR APPARATUS
HOLOGRAPHY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHOTOGRAPHY
PHYSICS
TESTING
title METHOD FOR OBSERVING A SAMPLE BY LENSLESS IMAGING
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