METHOD FOR OBSERVING A SAMPLE BY LENSLESS IMAGING

A method for observing a sample by lensless imaging, in which a sample is positioned between a laser diode and an image sensor, the laser diode being supplied with a supply current whose intensity is less than or equal to a critical value. This critical intensity is determined during preliminary ope...

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Bibliographische Detailangaben
1. Verfasser:	BLANDIN, Pierre
Format:	Patent
Sprache:	eng
Schlagworte:	CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHIC PROCESSES OR APPARATUS HOLOGRAPHY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHOTOGRAPHY PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A method for observing a sample by lensless imaging, in which a sample is positioned between a laser diode and an image sensor, the laser diode being supplied with a supply current whose intensity is less than or equal to a critical value. This critical intensity is determined during preliminary operations, during which the intensity is initially greater than a laser threshold of the diode. By observing the image formed at the image sensor, the intensity is decreased until an attenuation of the interference images on the formed image is observed, the critical intensity corresponding to the intensity at which this attenuation is optimum.