SOLID-STATE IMAGING DEVICE, DISTANCE MEASUREMENT DEVICE, AND MANUFACTURING METHOD

The present technology relates to a solid-state imaging device, a distance measurement device, and a manufacturing method that make it possible to improve condensing efficiency. Provided is a solid-state imaging device including: a pixel unit in which a plurality of pixels each having a light detect...

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Bibliographische Detailangaben
1. Verfasser:	TAKATSUKA, Yusuke
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC COMMUNICATION TECHNIQUE ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY PICTORIAL COMMUNICATION, e.g. TELEVISION SEMICONDUCTOR DEVICES
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Beschreibung
Zusammenfassung:	The present technology relates to a solid-state imaging device, a distance measurement device, and a manufacturing method that make it possible to improve condensing efficiency. Provided is a solid-state imaging device including: a pixel unit in which a plurality of pixels each having a light detection unit are arranged; a micro lens formed on a light incident surface side of the light detection unit for each of the pixels; and a light-shielding unit that is formed around the micro lens and shields light, wherein the micro lens is formed inside an opening part provided in the light-shielding part. The present technology is applicable to, for example, CMOS image sensors.