METHOD AND SYSTEM FOR IMPROVING THE OPERATION OF SEMICONDUCTOR PROCESSING

The present disclosure is directed to a system and method to identify and track parts of a semiconductor processing chamber, as well as the status of the parts, and store status information in a centralized location as status changes over time.

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Bibliographische Detailangaben
Hauptverfasser: SHANBHAG, Jeevan, CHEN, Chun-Chung, SALIMIAN, Siamak, CHO, Tom K, YANG, Yao-Hung, LIAO, Chien-Min, GANON, David, LUIGI, Mariana, HUNTER, Earl, YANG, Hsui
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present disclosure is directed to a system and method to identify and track parts of a semiconductor processing chamber, as well as the status of the parts, and store status information in a centralized location as status changes over time.