STAGE AND INSPECTION APPARATUS

A stage on which an inspection object having an electronic device is placed, the electronic device being pressed against a contact terminal of a probe card of an inspection apparatus by applying a load, includes: a first cooling plate including a first coolant flow path formed in the first cooling p...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: NAKAYAMA, Hiroyuki, AKAIKE, Yutaka, KOBAYASHI, Dai
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:A stage on which an inspection object having an electronic device is placed, the electronic device being pressed against a contact terminal of a probe card of an inspection apparatus by applying a load, includes: a first cooling plate including a first coolant flow path formed in the first cooling plate; a heating source mounted on the first cooling plate and configured to heat the inspection object; a transmission member installed on the heating source and transmits light output from the heating source; and a second cooling plate installed on the transmission member, including a placement surface configured to vacuum-suction the inspection object and a second coolant flow path, made of ceramic, and subjected to a mirror polishing process on the placement surface.