ANALYZER, ANALYSIS METHOD, ANALYZER PROGRAM, AND ANALYSIS LEARNING DEVICE

ANALYZER, ANALYSIS METHOD, ANALYZER PROGRAM, AND ANALYSIS LEARNING DEVICE

An analyzer that analyzes a measurement sample on the basis of spectrum data obtained by irradiating the measurement sample with light and includes a total analysis value calculation part that, on the basis of the total analysis value of a reference sample of which the total analysis value of multip...

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Hauptverfasser: ANDO, Yoshitake, ADACHI, Masayuki
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator ANDO, Yoshitake
ADACHI, Masayuki
description An analyzer that analyzes a measurement sample on the basis of spectrum data obtained by irradiating the measurement sample with light and includes a total analysis value calculation part that, on the basis of the total analysis value of a reference sample of which the total analysis value of multiple predetermined components are preliminarily obtained, calculates the total analysis value of the multiple components in the measurement sample from the spectrum data of the measurement sample.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title ANALYZER, ANALYSIS METHOD, ANALYZER PROGRAM, AND ANALYSIS LEARNING DEVICE
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