ANALYZER, ANALYSIS METHOD, ANALYZER PROGRAM, AND ANALYSIS LEARNING DEVICE

An analyzer that analyzes a measurement sample on the basis of spectrum data obtained by irradiating the measurement sample with light and includes a total analysis value calculation part that, on the basis of the total analysis value of a reference sample of which the total analysis value of multip...

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Bibliographische Detailangaben
Hauptverfasser:	ANDO, Yoshitake, ADACHI, Masayuki
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	An analyzer that analyzes a measurement sample on the basis of spectrum data obtained by irradiating the measurement sample with light and includes a total analysis value calculation part that, on the basis of the total analysis value of a reference sample of which the total analysis value of multiple predetermined components are preliminarily obtained, calculates the total analysis value of the multiple components in the measurement sample from the spectrum data of the measurement sample.