SYSTEMS AND METHODS FOR MEASURING AND VALIDATING KEY PERFORMANCE INDICATORS GENERATED BY MACHINE LEARNING MODELS

A device may receive, from a customer platform, customer event data identifying events occurring between customers and an entity, and may receive, from the customer platform, customer action data generated by machine learning models and identifying customer actions to be taken by the customer platfo...

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Hauptverfasser:	KRISHNAMURTHY, Srinivasan, MUTHUSAMY, Senthil, SHARMA, Rajat, KAMALAPURAM, Pavini, BEDSE, Pritam, ARREKUTI, Khagender, GANESH, Vinod Khanna Saini, RUSSO, John, McLAREN, Travis R, CHITTI, Rishi Kanth, MISHRA, Sailesh K
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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