Self-Mixing Interferometry-Based Absolute Distance Measurement with Distance Reference

A device includes a first component, a second component having a reconfigurable distance from the first component, an optical element, an SMI sensor, and a processor. The optical element has a fixed relationship with respect to the first component, and has a known optical thickness between a first s...

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Bibliographische Detailangaben
Hauptverfasser:	Mutlu, Mehmet, Cihan, Ahmet Fatih
Format:	Patent
Sprache:	eng
Schlagworte:	ANALOGOUS ARRANGEMENTS USING OTHER WAVES DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION ORRERADIATION OF RADIO WAVES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK PHYSICS RADIO DIRECTION-FINDING RADIO NAVIGATION TESTING
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Beschreibung
Zusammenfassung:	A device includes a first component, a second component having a reconfigurable distance from the first component, an optical element, an SMI sensor, and a processor. The optical element has a fixed relationship with respect to the first component, and has a known optical thickness between a first surface and a second surface of the optical element. The SMI sensor has a fixed relationship with respect to the second component, and has an electromagnetic radiation emission axis that intersects the first and second surfaces of the optical element. The processor is configured to identify disturbances in an SMI signal generated by the SMI sensor, relate the disturbances to the known optical thickness of the optical element, and to determine a distance between the first and second components using the SMI signal and the relationship of the disturbances to the known optical thickness of the optical element.