METHOD FOR CALIBRATING AN ANALYTICAL MEASURING DEVICE AND MEASURING POINT FOR ANALYZING A PROCESS MEDIUM AND FOR CALIBRATING AN ANALYTICAL MEASURING DEVICE

The invention relates to a method for calibrating an analytical measuring device in a measuring point. The method includes closing the outlet valve so that no process medium is discharged, closing the inlet valve so that no additional process medium is fed into the measuring point and a volume of pr...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Kaschuba, Dagmar, Hennings, Erik, Vettermann, Jens, Hanko, Michael, Pfauch, Thomas, Pechstein, Torsten, Jugert, Stephan
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The invention relates to a method for calibrating an analytical measuring device in a measuring point. The method includes closing the outlet valve so that no process medium is discharged, closing the inlet valve so that no additional process medium is fed into the measuring point and a volume of process medium is in the measuring point, feeding a predetermined volume of the calibration medium into the measuring point, circulating the calibration medium by means of the pump so that the flow circuit is generated and the calibration medium flows against the analytical measuring device, detecting a first measured for a calibration, repeating the steps of feeding the calibration medium into the measuring point, circulating the calibration medium, and detecting a measured value for the calibration, and evaluating the measured values and performing the calibration.