MEMORY MODULE STORING TEST PATTERN INFORMATION, COMPUTER SYSTEM COMPRISING THE SAME, AND TEST METHOD THEREOF

A memory module includes at least one semiconductor memory device, and a test pattern memory that stores first test pattern information for testing the at least one semiconductor memory device, and the first test pattern information stored in the test pattern memory is transferred to a host in a tes...

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Hauptverfasser:	Kang, Jiseok, OH, Jihyuk, Jung, Junho
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES
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creator	Kang, Jiseok OH, Jihyuk Jung, Junho
description	A memory module includes at least one semiconductor memory device, and a test pattern memory that stores first test pattern information for testing the at least one semiconductor memory device, and the first test pattern information stored in the test pattern memory is transferred to a host in a test operation. Through the memory module having the above-described function, a memory test is possible in consideration of a unique weak characteristic of the memory module.
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subjects	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES
title	MEMORY MODULE STORING TEST PATTERN INFORMATION, COMPUTER SYSTEM COMPRISING THE SAME, AND TEST METHOD THEREOF
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