MEMORY MODULE STORING TEST PATTERN INFORMATION, COMPUTER SYSTEM COMPRISING THE SAME, AND TEST METHOD THEREOF

MEMORY MODULE STORING TEST PATTERN INFORMATION, COMPUTER SYSTEM COMPRISING THE SAME, AND TEST METHOD THEREOF

A memory module includes at least one semiconductor memory device, and a test pattern memory that stores first test pattern information for testing the at least one semiconductor memory device, and the first test pattern information stored in the test pattern memory is transferred to a host in a tes...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Kang, Jiseok, OH, Jihyuk, Jung, Junho
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Beschreibung
Zusammenfassung:A memory module includes at least one semiconductor memory device, and a test pattern memory that stores first test pattern information for testing the at least one semiconductor memory device, and the first test pattern information stored in the test pattern memory is transferred to a host in a test operation. Through the memory module having the above-described function, a memory test is possible in consideration of a unique weak characteristic of the memory module.