SYSTEM AND METHOD FOR INTERNAL STRUCTURAL DEFECT ANALYSIS USING THREE-DIMENSIONAL SENSOR DATA

SYSTEM AND METHOD FOR INTERNAL STRUCTURAL DEFECT ANALYSIS USING THREE-DIMENSIONAL SENSOR DATA

A method and system for structural analysis of an object detects deviations between a physical object model and a predetermined three-dimensional model of the object. The physical object model is generated from scanned surface data of an object produced by a three-dimensional sensor. The physical ob...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Wilsher, Michael J
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Beschreibung
Zusammenfassung:A method and system for structural analysis of an object detects deviations between a physical object model and a predetermined three-dimensional model of the object. The physical object model is generated from scanned surface data of an object produced by a three-dimensional sensor. The physical object model is aligned with the predetermined three-dimensional model of the object to identify an interference between a location of the aligned physical object model and the predetermined three-dimensional model of the object that corresponds with any elastic deformation of an internal component within the predetermined three-dimensional model. An indicator of expected damage to the internal component arising from the elastic deformation is generated.