METALLIZATION STRUCTURES FOR STACKED DEVICE CONNECTIVITY AND THEIR METHODS OF FABRICATION

A stacked device structure includes a first device structure including a first body that includes a semiconductor material, and a plurality of terminals coupled with the first body. The stacked device structure further includes an insulator between the first device structure and a second device stru...

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Bibliographische Detailangaben
Hauptverfasser: Tsang, Chi-Hwa, Phan, Anh, Morrow, Patrick, Lilak, Aaron D, Rachmady, Willy, Tronic, Tristan A, Torres, Jessica M, Dewey, Gilbert, Chau, Robert S, Jun, Kimin, Yoo, Hui Jae, Jezewski, Christopher J
Format: Patent
Sprache:eng
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Zusammenfassung:A stacked device structure includes a first device structure including a first body that includes a semiconductor material, and a plurality of terminals coupled with the first body. The stacked device structure further includes an insulator between the first device structure and a second device structure. The second device structure includes a second body such as a fin structure directly above the insulator. The second device structure further includes a gate coupled to the fin structure, a spacer including a dielectric material adjacent to the gate, and an epitaxial structure adjacent to a sidewall of the fin structure and between the spacer and the insulator. A metallization structure is coupled to a sidewall surface of the epitaxial structure, and further coupled with one of the terminals of the first device.