TEST TIME REDUCTION FOR MANUFACTURING PROCESSES BY REMOVING A REDUNDANT TEST

Methods and systems of identifying a time reduction in a manufacturing time associated with a plurality of products. One system includes an electronic processor configured to receive a dataset associated with an assembly line. The dataset includes a classification for each of the plurality of produc...

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Hauptverfasser:	Tandarpally, Mahesh Goud, Ghosh, Rumi, Kang, Shan, Chen, Ruobing, Naumann, Marc, Srinivasan, Soundararajan
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING ELECTRIC DIGITAL DATA PROCESSING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING
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Beschreibung
Zusammenfassung:	Methods and systems of identifying a time reduction in a manufacturing time associated with a plurality of products. One system includes an electronic processor configured to receive a dataset associated with an assembly line. The dataset includes a classification for each of the plurality of products produced by the assembly line, where the assembly line is associated with a plurality of tests. The electronic processor is also configured to determine a set of test combinations for the assembly line based on the plurality of tests and, for each test combination, determine a number of missing products based on the classification for each of the plurality of products. The electronic processor is also configured to determine at least one test to remove based on the number of missing products for each test combination and output a result including an indication of the at least one test to remove.