TEST TIME REDUCTION FOR MANUFACTURING PROCESSES BY SUBSTITUTING A TEST PARAMETER

TEST TIME REDUCTION FOR MANUFACTURING PROCESSES BY SUBSTITUTING A TEST PARAMETER

Methods and systems of identifying a time reduction in a manufacturing time associated with a plurality of products. One system includes an electronic processor configured to receive training data. The electronic processor is also configured to determine a first set of testing parameters from the pl...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Tandarpally, Mahesh Goud, Ghosh, Rumi, Kang, Shan, Chen, Ruobing, Naumann, Marc, Srinivasan, Soundararajan
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
HANDLING RECORD CARRIERS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
PRESENTATION OF DATA
RECOGNITION OF DATA
RECORD CARRIERS
REGULATING
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Beschreibung
Zusammenfassung:Methods and systems of identifying a time reduction in a manufacturing time associated with a plurality of products. One system includes an electronic processor configured to receive training data. The electronic processor is also configured to determine a first set of testing parameters from the plurality of testing parameters to remove for the assembly line based on the training data and determine a second set of testing parameters to keep by removing the first set of testing parameters from the plurality of testing parameters. The electronic processor is also configured to determine a predictive model to replace the first set of testing parameters based on the training data associated with the second set of testing parameters, and automatically update a testing process for the assembly line to turn off the first set of testing parameters and use the predictive model in place of the first set of testing parameters.