Methods and Systems for Quantitative Ocular Surface Diagnostics

The present disclosure provides systems and methods for characterizing thin films, such as, for example, diagnosis of dry eye syndrome, thin-film optical metrology testing, etc. The present disclosure may be embodied as a tearscope, which is sometimes referred to herein as a Macroscopic Imaging Elli...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Zhang, Aizhong, Zavislan, James M
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present disclosure provides systems and methods for characterizing thin films, such as, for example, diagnosis of dry eye syndrome, thin-film optical metrology testing, etc. The present disclosure may be embodied as a tearscope, which is sometimes referred to herein as a Macroscopic Imaging Ellipsometer (MIE) because it may be considered to be an imaging ellipsometer with, for example, a field-of-view on the order of tens of millimeters or more (i.e., macroscopic), compared with conventional imaging ellipsometers, which usually employ microscope objectives and have fields-of-view of up to several hundred microns.